{"id":1010,"date":"2026-10-08T16:18:21","date_gmt":"2026-10-08T16:18:21","guid":{"rendered":"https:\/\/hanstech.de\/?page_id=1010"},"modified":"2026-10-08T16:32:30","modified_gmt":"2026-10-08T16:32:30","slug":"advanced-metrology","status":"publish","type":"page","link":"https:\/\/hanstech.de\/?page_id=1010","title":{"rendered":"Advanced Metrology"},"content":{"rendered":"\n<h1 class=\"wp-block-heading\">Advanced Optical Metrology<\/h1>\n\n\n\n<p class=\"wp-block-paragraph\">Non-contact optical measurement for semiconductor and precision manufacturing applications.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Hanstech supplies measuring instruments and provides application support to help customers evaluate surface features, dimensions and geometry. We work with customers to match the measurement technology and system configuration to the sample, task and operating environment.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">Measurement Applications<\/h2>\n\n\n\n<h3 class=\"wp-block-heading\">Surface Topography and Step Height<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Evaluate surface profiles, height differences and three-dimensional features on precision components and semiconductor-related samples.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Flatness, Bow and Warpage<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Assess sample geometry using measurement and analysis methods suited to the material, dimensions, support conditions and reference definition.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Thickness and Layer Measurement<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Discuss suitable approaches for thickness measurement, including transparent materials and film structures where the optical properties and layer configuration permit.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Microstructures and Probe Geometry<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Evaluate bump heights, coplanarity and probe positions. Application-specific systems can support the localization of defective probes for targeted rework.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">Select the System Around the Measurement Task<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">A suitable configuration depends on more than the required measuring range. We review:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Sample dimensions, material and surface condition<\/li>\n\n\n\n<li>Required measurement parameters and feature sizes<\/li>\n\n\n\n<li>Accuracy, repeatability and throughput requirements<\/li>\n\n\n\n<li>Sample handling, fixtures and environmental conditions<\/li>\n\n\n\n<li>Data analysis, reporting and automation needs<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Depending on the application, available approaches may include chromatic confocal measurement, white-light interferometry and reflectometry. Suitability is assessed for the specific sample and measurement task.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">From Evaluation to Daily Operation<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Our support covers equipment selection, coordination of sample evaluations, installation, operator training and after-sales assistance within the agreed scope of supply.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Where feasibility needs to be established, sample measurements can help define an appropriate configuration before purchase.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">Discuss Your Measurement Task<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Tell us what you need to measure, the size and material of your sample, and the result you need to achieve. Sample photographs, drawings and existing measurement reports are helpful starting points.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Request an Application Review<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>View Related Applications<\/strong><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Advanced Optical Metrology Non-contact optical measurem [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":1006,"menu_order":1,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-1010","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages\/1010","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/hanstech.de\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=1010"}],"version-history":[{"count":1,"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages\/1010\/revisions"}],"predecessor-version":[{"id":1012,"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages\/1010\/revisions\/1012"}],"up":[{"embeddable":true,"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages\/1006"}],"wp:attachment":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=1010"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}