From semiconductor inspection to custom equipment components, Hanstech connects application requirements with suitable measuring instruments and specialized manufacturing partners.<\/p>\n\n\n\n
Explore how our products and services support different measurement and component needs.<\/p>\n\n\n\n
Non-contact optical measurement supports the evaluation of wafer geometry, surface topography and microstructure heights.<\/p>\n\n\n\n
Typical tasks include step-height measurement, bump coplanarity and the assessment of flatness, bow or warpage. The appropriate method depends on the sample, surface properties, feature dimensions and required throughput.<\/p>\n\n\n\n
We help clarify the measurement task and coordinate equipment selection and application evaluation.<\/p>\n\n\n\n
Explore Advanced Metrology<\/strong><\/p>\n\n\n\n Probe card inspection requires reliable information about probe height, coplanarity and position.<\/p>\n\n\n\n Application-specific measurement systems can help identify and localize defective probes, giving operators a clearer basis for targeted rework. Measurement after repair supports verification of the resulting probe geometry.<\/p>\n\n\n\n We support discussions on measurement configuration, sample holding and the inspection-to-rework workflow.<\/p>\n\n\n\n Discuss a Probe Card Application<\/strong><\/p>\n\n\n\n Measurement and semiconductor equipment often require custom structural bases with defined reference surfaces and mounting interfaces.<\/p>\n\n\n\n We coordinate granite bases, gantries and related components according to drawing-specific requirements. Technical review covers geometry, inserts, support conditions and interfaces with the surrounding equipment.<\/p>\n\n\n\n Inspection and delivery requirements are agreed as part of the project.<\/p>\n\n\n\n Explore Granite Structures<\/strong><\/p>\n\n\n\n Measurement fixtures must locate and support the sample while remaining practical for operators to load, inspect and maintain.<\/p>\n\n\n\n We coordinate custom fixtures for probe card measurement and other cleanroom applications. Drawing review addresses positioning, access, material selection, surface finish and specified cleaning and packaging requirements.<\/p>\n\n\n\n The scope is defined for the customer\u2019s application and operating environment.<\/p>\n\n\n\n Explore Precision Machined Parts<\/strong><\/p>\n\n\n\n Some measurement assemblies require components with low thermal expansion to help limit dimensional changes as temperature varies.<\/p>\n\n\n\n We coordinate the machining of Invar components according to the specified grade, geometry and interface requirements. Review focuses on critical dimensions, fits and inspection needs.<\/p>\n\n\n\n Material selection is assessed in the context of the complete assembly and its operating conditions.<\/p>\n\n\n\n Discuss an Invar Component<\/strong><\/p>\n\n\n\n Visible audio components require both accurate mechanical interfaces and carefully controlled surface appearance.<\/p>\n\n\n\n We coordinate custom knobs, housings and related parts with finishes selected to suit the material and design. Requirements may include brushed or polished surfaces, matte appearance, anodizing or powder coating.<\/p>\n\n\n\n Cosmetic expectations, reference samples and inspection criteria are clarified before production.<\/p>\n\n\n\n Discuss an Audio Component<\/strong><\/p>\n\n\n\n Send us a sample description, drawing or measurement challenge. We will help identify the information needed to evaluate the next step.<\/p>\n\n\n\n Contact Hanstech<\/strong><\/p>\n","protected":false},"excerpt":{"rendered":" From semiconductor inspection to custom equipment compo […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-1032","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages\/1032","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/hanstech.de\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=1032"}],"version-history":[{"count":1,"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages\/1032\/revisions"}],"predecessor-version":[{"id":1034,"href":"https:\/\/hanstech.de\/index.php?rest_route=\/wp\/v2\/pages\/1032\/revisions\/1034"}],"wp:attachment":[{"href":"https:\/\/hanstech.de\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=1032"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}Probe Card Inspection & Rework<\/h2>\n\n\n\n
Granite Structures for Precision Equipment<\/h2>\n\n\n\n
Cleanroom Measurement Fixtures<\/h2>\n\n\n\n
Invar Components for Precision Metrology<\/h2>\n\n\n\n
High-End Hi-Fi Audio Components<\/h2>\n\n\n\n
Tell Us About Your Application<\/h2>\n\n\n\n